Thin film photovoltaics (TFPV) are being developed as a cheaper alternative to silicon-based wafers. There are three main types of thin-film photovoltaics, named according to their effective layer composition: silicon thin films, II-VI (mainly cadmium antimonide), and CIGS (copper indium gallium selenide). Each effective layer film is used on top of a transparent conductive oxide film, and the substrate can be made of glass or metal.
Measure effective layer
Accurately understanding the thickness and composition of the effective layer is crucial. Being too thin can affect effectiveness and durability, while being too thick can increase costs. Incorrect composition can greatly reduce the efficacy and manufacturing yield of the product.
The Filmetrics F20 model is used by dozens of thin-film photovoltaic manufacturers to measure the thickness and optical constants of three types of effective layers. In order to measure the effective layer of thin film on transparent conductive oxide film, Filmetrics has gained rich experience in detecting single-layer and multi-layer conductive glass produced by users themselves or provided by professional glass manufacturers.
Other process films
In addition to the effective layer and transparent conductive oxide stack, there are other thin films used in the manufacturing of photovoltaic products. These examples include polyimide and photoresist used for etching batteries and electrodes, as well as anti reflective coatings. In these cases, Filmetrics has existing desktop, surveying, or online solutions.
Measurement Example
Fast and reliable measurement of multilayer thin films is key to the development and manufacturing of thin film solar cells. In this case, we need to measure the thickness of the buffer layer (cadmium sulfide) and absorption layer (cadmium telluride) on the thin film photovoltaic. The combination of F20-NIR and collimated beam platform enables us to measure the thickness of cadmium telluride and cadmium sulfide layers on solar cells on TEC glass from reflectance spectra.
Measurement setting
F20-NIR registration straight beam fiber
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