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- / UNICORN × KLA Joint Special Exhibition Stand | CIOE Exhibition Stand, Hall 7, 7B13, draw Hermes gift boxes on site!
The 26th China International Optoelectronics Expo (CIOE) will be held from September 10-12, 2025 at the Shenzhen International Convention and Exhibition Center. Focusing on eight cutting-edge fields including information communication, precision optics, camera technology and applications, laser manufacturing, infrared and ultraviolet, intelligent sensing, new displays, and AR/VR.
Nikon booth7B13Inviting you to attend the exhibition, this exhibition is jointly organized by Unicon and KLA Instruments. The on-site equipment includes KLA Filmetrics optical film thickness gauge, KLA optical profilometer, probe profilometer, nanoindentation instrument, ellipsometer, etc. If you have any needs for using or testing the above equipment, please feel free to visit the Younikon booth to learn and test samples. There are also various gifts waiting for you to receive.
Follow Unocal official account
Reply to [7B13] Appointment Registration
Scan to register
Obtain CIOE audience tickets
Date of participation
September 10-12, 2025
Nikon booth:Building 7, 7B13
Audience invitation letter
You are welcome to scan the QR code above to follow the Unocal official account, reply to [7B13] to make an appointment for registration, and stack multiple gifts! We have prepared a variety of prizes and activities for you to participate in on-site!
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Filmetrics F20 single point portable film thickness measuring instrument | ||
Do you want to know the thickness and optical constants of the film, or do you want to know the reflectivity and transmittance of the material? F20 can meet your needs. It only takes a few minutes to complete the installation, and the device can obtain measurement results within seconds by connecting to a computer via USB. Based on the characteristics of a modular design, F20 is suitable for various applications. | ||
Related applications:Photoresist, process film, dielectric materialHard coatingParylene、Anti reflection layerMedical equipment OLED、 Glass thickness, ITO, and other TCO. |
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Filmetrics F40 Thin Film Measuring Instrument | ||
Combined with the film thickness measurement system of the microscope,Filmetrics' special film thickness measurement system allows users to easily and quickly measure the thickness of thin filmsOptical constants can be obtained within seconds by analyzing the reflection spectra between the upper and lower interfaces of the tested film layerTo the measurement results. | ||
Related applications:Photoresist, semiconductor manufacturing, polymer/poly (p-xylene)Biomedical componentsMEMS microelectromechanical systemsBox thicknessOxide/nitrideSilicon or other semiconductor film layersThickness of biofilm/bubble wallImplant drug coatingSilicon filmAluminum nitride/zinc oxide thin film filterPolyimideITO conductive transparent film. |
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Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument | ||
Automated film thickness drawing system,By relying on the special spectral measurement system of F50, it is very simple and fast to obtain the maximum direct currentThickness distribution map of a sample film with a diameter of 450 millimeters. Using an r - θ polar coordinate moving platform,It can quickly locate the required testing points and obtain real-time testing thickness, approximatelyCan test two points per second. The F50 system is equipped with a high-precision and long-life mobile platform, striving for excellenceRealize millions of measurements. | ||
Related applications:Semiconductor manufacturing of LCD liquid crystal displaysPhotoresistPolyimideOxide/Nitride/SOIITO transparent conductive filmGrinding the backside of the waferOptical coating MEMS microelectromechanical systemsHard coatingPhotoresistAnti reflection layerSilicon based film layer. |
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KLAZeta-20White light confocal profilometer | ||
Multi functional optical testing module,Zeta-20 provides various optical testing techniques to meet users' testing needs in various fields.Based on ZDot technology, Zeta-20 can perform imaging analysis on almost all materials and structures, from ultra smooth to high roughness, low reflectivity to high reflectivitySurface emissivity, transparent to opaque medium. | ||
Related applications:Huizhou Fluid Device、IC wafer surfaceMEMS devicesHuizhou Gear/Micro Machinery, Laser Drilling, Disk Inverted Edge. |
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KLA iMicroNano mechanics tester | ||
Flexible and easy-to-use mechanical testing can be widely used for various materials and applications,IMicro provides nanoscale testing for indentation, hardness, scratch testing, and diversified nanoscale testingGrade mechanical testing design. IMicro has a multi range loading driver that enables wideMeasure within the range of general load and displacement. | ||
Related applications:Hard coatingCeramics and glassMetals and alloysComposite materialsCoatings and paintsMedical equipmentSemiconductorBatteries and energy storage materialsAutomotive and Aerospace |
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Profilm3D White Light Interference Profilometer | ||
Profilm3D utilizes state-of-the-art vertical interference scanning (WLI) and high-precision phase interference (PSI) technology. Realize sub nanometer level surface morphology research with strong cost-effectiveness. | ||
Related applications:Roughness measurement; Three dimensional morphology characterization; Step height measurement |
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FS-1 multi wavelength ellipsometer | ||
The Film Sense FS-1 multi wavelength ellipsometer uses a long-life LED light source and a non moving component ellipsometer detector, which can achieve reliable thin film measurement in a compact ellipsometer with simple operation. | ||
Related applications:Silicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon thin films, photoresist.High and low index thin films, such as SiO2, TiO2, Ta2O5, MgF2.TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc |
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