Conference Preview | Younikon invites you to attend the 2025 National Conference on Electron Microscopy

2026-06-27 16:45:51 优尼康
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The 2025 National Conference on Electron Microscopy will be held at the Wuhan International Conference Center. In today's era where innovation in new quality productivity plays a leading role, microscopy professionals take it as their responsibility to revitalize the electron microscopy industry, target major national needs and international cutting-edge scientific issues, and continuously contribute to the resolution of bottleneck problems in China. Chinese electron microscopy scholars are an indispensable force.


As a sponsor, Unicon participated in this conference and launched a heavyweight productOne stop solution for characterization testing equipmentplanWelcome to on-site communication.


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Meeting address

Wuhan International Conference Center


Audience participation date

September 26th to September 30th, 2025 (26th reporting date)

The Unicon exhibition is located on the 5th floor5-30


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Meeting agenda

Focus on core issues

The topics for the fifteen sub venues are as follows:

1) Microscopy theory, instrument methods and techniques;

2) In situ electron microscopy characterization;

3) Characterization of microstructure of functional materials;

4) Structural materials and defects, interfaces, surfaces, phase transitions and diffusion;

5) The application of advanced microscopic analysis technology in industrial materials;

6) Scanning probe microscopy characterization (STM/AFM, etc.);

7) Characterization of material microstructure using electron diffraction and electron microscopy holography (including SEM, EBSD, and TEM);

8) The application of focused ion beam (FIB) in materials science;

9) Low temperature electron microscopy characterization;

10) Development and application of biomedical electron microscopy technology;

11) The application of microscopy in the fields of agriculture, forestry, and biological sciences (such as super-resolution microscopy, confocal laser microscopy, etc.);

12) Research and application of agricultural and forestry electron microscopy;

13) Advanced material microscopic characterization and cutting-edge innovation;

14) Microscopic scientific instruments and material microstructure processing technology;

15) Intelligent upgrade and open sharing of microscopy platform.


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We have been deeply involved in the thin film measurement industry for over ten years. No matter what problems you have in thin film measurement, our technical experts can provide you with valuable advice or solutions. Welcome to call, we are pleased to discuss your application issues with you.

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Consultation hotline: 400-186-8882

E-mail info@unicorn-tech.com

Younikon Technology Co., Ltd

Yiying Technology (Shanghai) Co., Ltd

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More topics

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Solution for Measuring Film Thickness in SiC Semiconductors

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The principle and application of KLA probe type step meter

3

The Importance of Environmental Stability in High Resolution Measurement


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