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N1 Hall 1667 | Younikon invites you to attend SEMICON CHINA and draw the Hermes mysterious gift box on site!

2026-06-27 16:45:51 优尼康

SEMICON China 2026 will be held grandly at the Shanghai New International Expo Center from March 25th to 27th. Covering all aspects of the microelectronics and integrated circuit industry chain, including equipment, materials, design, manufacturing, packaging and testing, software, and services, we are committed to promoting research and development innovation and promoting sustainable industrial development.

Nikon boothN1 Hall 1667We invite you to attend the exhibition. This time, we have moved our laboratory to the site, where you can have close contact with high-precision testing equipment such as KLA Filmetrics optical film thickness gauge, KLA optical profilometer, probe profilometer, ellipsometer, stair step gauge, etc. If you have any usage or sample testing needs for the above equipment, please feel free to visit the Younikon booth for on-site understanding and sample testing.

Scan the QR code on the left side below to make an appointment for on-site testing. The booth has prepared a variety of gifts, including Hermes mysterious gift boxes, internet famous blind boxes, etc. More activities are available at the Younikon booth N1 hall 1667. Welcome everyone to come and exchange ideas on site!

Scan the code to make an appointment for sample testing

Senior technical on-site 1V1 communication

Scan to register

Get admission tickets to SEMICON

Precision thin film measurement expert

Younikon Technology Co., Ltd. | Yiying Technology (Shanghai) Co., Ltd

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Exhibition Time:

March 25-27, 2026

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Exhibition location:

Shanghai New International Expo Center

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Booth layout:

Nikon booth, Hall N1, No. 1667

Audience invitation letter

Numerous surprise gifts on site！

Hermes mysterious gift box, internet celebrity blind box, unicorn keychain and many other surprises! We'll see you on site!

Exhibition equipment

Filmetrics film thickness gauge


Filmetrics F20 single point portable film thickness gauge
Whether you want to know film thickness, optical constants, or material reflectivity and transmittance, F20 can meet your needs. It only takes a few minutes to complete the installation, and the device can obtain measurement results within seconds by connecting to a computer via USB. Based on the characteristics of a modular design, F20 is suitable for various applications.
Related applications:Photoresist, process film, dielectric materialHard coatingParylene、Anti reflection layerMedical equipment OLED、 Glass thickness, ITO, and other TCO.

Filmetrics F40 Thin Film Thickness Measuring Instrument
The F40 spectral measurement system allows users to easily and quickly measure the thickness and optical constants of thin films. By analyzing the reflection spectra between the upper and lower interfaces of the tested film layer, the results can be measured within seconds.
Related applications:Semiconductor manufacturing (photoresist, oxide/nitride/SOI, semiconductor film layer); Biomedical components (polymers, poly (p-xylene)); MEMS microelectromechanical systems (photoresist, silicon film); LCD liquid crystal display (box thickness, polyimide, ITO conductive transparent film).

Filmetrics F50 Automatic Mapping Film Thickness Gauge
F50 can easily achieve maximum straightThickness distribution map of sample film with a diameter of 450 millimeters. Using an r - θ polar coordinate moving platform,Can quickly locate the required test points and obtain real-time test thickness, approximatelyTest two points per second.
Related applications:Semiconductor manufacturing (photoresist, oxide/nitride/SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti reflection layer); MEMS microelectromechanical systems (photoresist, silicon-based film layers).

Filmetrics F54-XY-200 Automatic Optical Film Thickness Measuring Instrument
The F54-XY-200 film thickness gauge can measure the thickness of thin films on samples up to 200x200mm in size. The electric XY worktable automatically moves to the selected measurement point and provides thickness measurement at two points per second..
Related applications:Semiconductor film layers (photoresist, dielectric layer, gallium arsenide, microelectromechanical systems); Display technology (OLED, ITO and TCOs, air box thickness, PVD and CVD); Consumer electronics (waterproof coating, radio frequency identification, solar cells, aluminum shell anode film); Perilin (electronic products, circuit boards, magnetic materials, medical devices, silicone rubber)）.

FS-RT300 multi wavelength ellipsometer
The Film Sense FS-RT300 multi wavelength ellipsometer uses a long-life LED light source and a non mobile component ellipsometer detector, which can achieve reliable thin film measurement in a compact ellipsometer with simple operation.
Related applications:Silicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon thin films, photoresist. High and low index thin films, such as SiO2, TiO2, Ta2O5, MgF2. TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc.


Profilm3D White Light Interference Profilometer
Profilm3D utilizes state-of-the-art vertical interference scanning (WLI) and high-precision phase interference (PSI) technology. Realize sub nanometer level surface morphology research with strong cost-effectiveness.
Related applications:Roughness measurement; Three dimensional morphology characterization; Step height measurement


KLA P-7 probe step meter
The KLA P-7 probe step meter is a probe step meter system from KLA Corporation. It can measure the height, roughness, curvature, and stress of steps in both 2D and 3D, with a scanning range of up to 150mm without the need for image stitching.
Related applications:Thin film/thick film step, flexible film, photoresist/photoresist step, etching depth measurement, surface curvature and contour analysis, 3D contour imaging;


KLA R50 four probe resistivity measuring instrument
The R50 series resistance tester offers two measurement schemes: contact four point probe (4PP) and non-contact eddy current (EC), with a measurement range spanning 10 orders of magnitude and an accuracy of up to ± 0.2%. Specially optimized for measuring the resistance and thickness of conductive thin films in industries such as semiconductor manufacturing, flexible electronic products, and solar cells, ensuring excellent measurement repeatability and accuracy.
Related applications:Semiconductors, solar energy, flat panel and VR displays, compound semiconductors, advanced packaging, conductive materials, wearable devices, printed circuits;


MINI450F active shock absorber platform
The mini desktop active vibration isolation table is newly designed, easy to use, and has excellent vibration isolation performance.
Related applications:SPM，AFM， Stepper, optical profiler, laser interferometer, desktop SEM, laser confocal microscope,Surface roughness tester, small hardness tester, electronic balance, hard disk manufacturing device, micro manipulation robot, and other precision devices.

We have been deeply involved in the thin film measurement industry for over ten years. No matter what problems you have in thin film measurement, our technical experts can provide you with valuable advice or solutions. Welcome to call, we are pleased to discuss your application issues with you.

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