The X-ray fluorescence (XRF) coating thickness gauge is an instrument designed for measuring coating thickness. Taking the Bowman BA-100 Optics provided by Unicon Technology Co., Ltd. as an example, let's briefly understand what a desktop X-ray fluorescence coating thickness gauge is.
The Bowman BA-100 Optics model adopts a porous capillary optical focusing device, which can reduce the measurement point spot while increasing the X-ray excitation intensity.
The Bowman BA-100 Optics model is equipped with a large area of SDD (silicon drift detector), which effectively expands the range of element analysis and adapts to strict micro area, ultra-thin coating, and trace element analysis requirements.
The Bowman BA-100 Optics model is a research and development XRF coating thickness and elemental composition analysis instrument with strict quality control for testing performance and outstanding micro area measurement capabilities.
Stable X-ray tube
Micro focused 50 watt Mo target ray tube (other target materials are optional); Measurement spots smaller than 100um
The radiation exit point is pre-set in the center of the Be window of the radiation tube
Long life radiation tube filament
● Unique preheating and ISO temperature adaptation program
Multi capillary focusing optical structure
Significant increase in X-ray signal intensity
● Obtain signal strength several times or even tens of times higher than that of collimator models
Measurement spots with a diameter less than 100um
Verified and accurate measurement accuracy
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