In precision engineering fields such as semiconductor wafer manufacturing, new display coatings, and biomedical coatings, the uniformity and accuracy of film thickness directly determine the electrical performance, optical transmittance, and long-term reliability of devices. However, many production lines still use offline sampling or single point contact measurement, which makes it difficult to capture process drift in real time, resulting in high batch scrap rates. In response to this pain point, Unicon Technology has launched high-precision technologyFilm thickness measuring instrumentBased on the principle of light reflection interference, non-contact thickness detection can be completed within seconds, providing closed-loop quality control support for thin film processes from research and development to mass production.
The film thickness measuring instrument provided by Younikon has reached the industry-leading level in product parameters. Taking general equipment as an example, the wavelength range covers 380-1050nm, and the thickness detection interval is 15nm to 70 μ m; When paired with UV extended models, the lower limit can be extended to 1nm, while near-infrared models can measure coatings up to 2mm thick. The measurement accuracy (standard deviation) can reach a minimum of 0.02nm, with an accuracy of up to 1nm or 0.2% relative error, and stability better than 0.05nm. This means that even for ultra-thin films deposited by atomic layers, the instrument can reliably distinguish thickness differences at the single atomic level.
Semiconductor and advanced packaging: The thickness of silicon oxide, silicon nitride dielectric layer, polyimide passivation layer, etc. on the wafer surface must be strictly controlled. The Younikon film thickness measuring instrument can support sample stages with a maximum diameter of 450mm. With automatic multi-point mapping function, it can quickly generate 2D/3D thickness distribution maps and accurately identify process defects such as edge thinning or center protrusion. In actual testing, the measurement speed can reach about 2 points per second, greatly improving the efficiency of batch sampling.
New displays and consumer electronics: Organic light-emitting layers, waterproof coatings, aluminum shell anodized films, etc. in OLED devices require both high precision and small measurement areas. The Younikon film thickness measuring instrument provides a minimum light spot option of 10-20 microns, which can accurately locate the micro film layer on the display pixel area or circuit board, and supports surface sample measurement.
Biomedical and New Materials: Perilin coatings, silicone rubber films, and biodegradable drug loaded coatings on the surface of medical devices are often soft or curved structures. By utilizing the non-contact characteristics of the film thickness measuring instrument, the detection of liquid film or air box thickness can be completed without complex preprocessing, while supporting multi parameter outputs such as reflectivity and transmittance.
In addition, for special applications, Nikon can also choose transmittance measurement accessories, microscope connection accessories, and automatic sample stage to further expand the measurement dimensions.
Thickness range coverage: Standard visible light models (380-1050nm) can measure 15nm-70 μ m; The UV extension model (190-340nm) extends down to 1nm-40 μ m; The near-infrared model (1310nm) covers 7 μ m-2mm. A single device can meet the full range detection from ultra-thin functional layers to thick protective coatings.
Repetition accuracy and precision: In the repeated testing of single-layer film standard plates, the standard deviation (accuracy) of 30 consecutive measurements can be as low as 0.02nm; the accuracy compared with the reference value is controlled within 1nm or 0.2%. For example, for a 100nm thick oxide film, the measurement range of the Nikon film thickness gauge is usually less than 0.3nm.
Spot and sample compatibility: The standard spot diameter is 1.5mm, and with the optional small spot module, it can be reduced to 150 μ m or even 20 μ m (specific objective lens required). The sample stage is compatible with 1mm micro samples to 300mm standard wafers, and can achieve full area scanning through an automatic sample stage.
These data indicate that the Younikon film thickness measuring instrument is not only suitable for precision verification in the laboratory research and development stage, but can also be seamlessly integrated into the online monitoring system of the production line. With embedded real-time diagnosis and offline analysis software, engineers can trace historical data at any time and quickly locate abnormal batches.
In the after-sales process, Younikon has established a nine step standard operating procedure of "communication needs → free sample testing → equipment confirmation → quotation communication → contract signing → shipment arrangement → installation appointment → debugging and training → acceptance", equipped with experienced senior engineers in the industry to provide one-on-one technical support. At the same time, the 7 × 24-hour online service and 8-hour rapid after-sales response mechanism ensure that any problems encountered by customers during the use of the film thickness measuring instrument can be resolved in a timely manner. In addition, Younikon also provides a full range of spare parts such as light sources, thickness standard films, probes, as well as value-added services such as equipment maintenance and system integration, covering the entire life cycle of the equipment.
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