返回 |
HOME
/ NEWS
/ Company
/ [Exhibition Information] Unicon invites you to meet at the Shanghai New International Expo Center

[Exhibition Information] Unicon invites you to meet at the Shanghai New International Expo Center

2025-09-02 15:23:22 admin

The 2024 SEMICON CHINA and the Laser World of Photonics China will be held concurrently at the Shanghai New International Expo Center. Uniconon will bring multiple devices to participate in this grand event. You can scan the QR code below the article to make an online reservation and sign up in advance. We look forward to meeting you on the spot. We have prepared many exquisite small gifts for you to collect.

SEMICON CHINA

Booth NumberHall N1, Room 1671

The Laser World of Photonics China in Shanghai

Booth NumberHall W4, Room 4168

Exhibition hall floor plan

SEMI Exhibition Reservation

Munich Exhibition Reservation

You can scan the QR code above to make an appointment for a visit

Looking forward to your arrival!!

Exhibition equipment

Filmetrics F50 Film Thickness Measuring instrument

The F50 can very simply obtain the thickness distribution map of sample films with a maximum diameter of 450 Youdaoplaceholder0. By using the r-θ polar coordinate moving platform the required test points can be quickly located and the test thickness can be obtained in real time, approximately 2 points per second.

Related applicationsSemiconductor manufacturing (photoresist, oxides/nitrides /SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti-reflection layer); MEMS micro-electromechanical systems (photoresist, silicon-based film layers).

Bowman XRF Coating Thickness gauge

It has a 12 x12-inch measurable area superior to similar products on workpieces with a height not exceeding 9 inches. The automatic multi-collimator allows for the selection of spot sizes to accommodate various feature sizes. The zoom camera allows for measurements within a focal length range of 0.25 inches to 3.5 inches.

Related applicationsTest of refractive index extinction coefficient of materials Testing of the thickness of the natural oxide layer on silicon wafers Test of optical constants of photoresist Measurement of metal thickness on silicon in the back-end packaging of semiconductors

Lumina AT2 Defect Detector

The film defect detector enables full surface scanning and imaging of sub-nanometer film coatings, nanoparticles, scratches, pits, protrusions, stress points and other defects.

Related applicationsAll types of defects; Thin and thick substrate; Transparent and opaque substrates; Dielectric coating Metal coating; Bonded silicon wafers Development and online production

More models are waiting for you to experience on site...