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CIOE China Optoelectronic Expo is coming with great enthusiasm. Unicon invites you to join this grand event!

2025-09-02 15:23:22 admin

This year's CIOE China Optoelectronic Expo has gathered over 3,700 high-quality exhibitors from more than 30 countries and regions around the world. As a comprehensive exhibition covering the entire optoelectronic industry chain, it encompasses sections such as information and communication, precision optics, camera technology and applications, lasers and intelligent manufacturing, infrared, ultraviolet, intelligent sensing, and new displays. Uniconon will participate in the 25th China Optoelectronic Expo!

We sincerely invite you to visit the exhibition

Unicon will bring a variety of film thickness gauges to the exhibition

Looking forward to discussing with you on-site the various applications of film thickness measurement!

There are more fun interactions on site, waiting for you to win prizes

Unicon is in Hall 3 of the Shenzhen International Convention and Exhibition Center

Preview image of the exhibition hall

Unicon booth3B22

Booth Preview

More exciting activities are gradually being unlocked

100% winning probability? Fun prizes? Participate and get it!

Exhibition equipment


F50 Film thickness Measuring instrument
The F50 can achieve maximum straightness very simplyThickness distribution map of the sample film with a diameter of 450 millimeters. The r-θ polar coordinate moving platform is adoptedIt can quickly locate the required test points and obtain the test thickness in real time, approximatelyTest two points per second.
Related applicationsSemiconductor manufacturing (photoresist, oxides/nitrides /SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti-reflection layer); MEMS micro-electromechanical systems (photoresist, silicon-based film layers).


P7 Step gauge
The P-7 can perform 2D and 3D measurements of step height, roughness, warpage and stress, and its scanning can reach 150mm without image stitching.
Related applicationsFilm/thick film steps Etching depth measurement Photoresist/photoresist step Flexible film Characterization of surface roughness/flatness; Surface curvature and contour analysis; 2D stress measurement of thin films Surface structure analysis 3D contour imaging of the surface Defect characterization and defect analysis.


F54-XY-200 Film Thickness Measuring instrument
The F54-XY-200 is equipped with an automated film thickness plotting system.With the advanced spectral reflection system of the F54-XY-200, the film thickness of samples up to 200 x 200mm can be measured quickly and easily.
Related applicationsSemiconductor manufacturing (photoresist, oxides/nitrides /SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti-reflection layer); MEMS micro-electromechanical systems (photoresist, silicon-based film layers).


Profilm3D White Light Interference Optical Profilometer
Profilm3D employs the most advanced vertical interference scanning (WLI) and high-precision phase interference (PSI) technologies. Achieve sub-nanometer surface morphology research with strong cost performance.
Related applicationsRoughness measurement Three-dimensional topography characterization Measurement of step height


FS-1 multi-wavelength ellipsometer
The Film Sense FS-1 multi-wavelength ellipsometer adopts a long-life LED light source and a non-moving component ellipsometer detector, enabling reliable film measurement in a compact ellipsometer with simple operation.
Related applicationsSilicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon films, photoresists.High and low index films, such as SiO2, TiO2, Ta2O5, MgF2.TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc