The countdown to the Laser World of Photonics CHINA in Shanghai and SEMICON CHINA has begun!
As a grand event in the Asian laser, optical and optoelectronic industry, it gathers well-known domestic and foreign enterprises in the industry, providing a complete product chain display platform for the optoelectronic industry from components to system integration solutions.The exhibition will continue to uphold technological innovation as its core, be courageous in breaking through, constantly innovate, and strive to promote the transformation and upgrading of the optoelectronic industry, making greater contributions to the sustained prosperity of the global optoelectronic industry.
Uniconon will participate in the LASER World of Photonics China in Shanghai. We look forward to discussing with you on site about the application of Uniconon equipment in the semiconductor field and contributing to the development of the industry.
This exhibition isFree exhibition participation
For more details, you can scan the code to pre-register
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Meeting time
March 11th - 13th, 2025
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Exhibition Venue
Shanghai New International Expo Center
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Booth layout
Unicon booth 2729, Hall N2
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Exhibited equipment
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F50 Film thickness Measuring instrument | ||
The F50 can achieve maximum straightness very simplyThickness distribution map of the sample film with a diameter of 450 millimeters. The r-θ polar coordinate moving platform is adoptedIt can quickly locate the required test points and obtain the test thickness in real time, approximatelyTest two points per second. | ||
Related applicationsSemiconductor manufacturing (photoresist, oxides/nitrides /SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti-reflection layer); MEMS micro-electromechanical systems (photoresist, silicon-based film layers). |
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Profilm3D White Light Interference Optical Profilometer | ||
Profilm3D employs the most advanced vertical interference scanning (WLI) and high-precision phase interference (PSI) technologies. Achieve sub-nanometer surface morphology research with strong cost performance. | ||
Related applicationsRoughness measurement Three-dimensional topography characterization Measurement of step height |
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FS-8 multi-wavelength ellipsometer | ||
The Film Sense FS-8 multi-wavelength ellipsometer adopts a long-life LED light source and a non-moving component ellipsometer detector, enabling reliable film measurement in a compact ellipsometer with simple operation. | ||
Related applicationsSilicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon films, photoresists.High and low index films, such as SiO2, TiO2, Ta2O5, MgF2.TCO (such as ITO), amorphous silicon films, organic films (OLED technology), etc |
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MNi-450F Desktop active vibration isolation table | ||
The MNi-450F desktop active vibration isolation table is newly designed, easy to use and features excellent vibration isolation performance.It offers excellent anti-vibration performance across the entire frequency band without resonance. | ||
Related applicationsSPM,AFM, step meter, optical profilometer, laser interferometer, desktop SEM, laser confocal microscope, surface roughness meter, small hardness tester, electronic balance, hard disk manufacturing equipment, micro-operation robot, and other precision devices |
SEMI is committed to promoting the development of China's semiconductor, flat panel display, solar photovoltaic, compound semiconductor, intelligent transportation, intelligent manufacturing and other industries, facilitating exchanges and cooperation between the global and domestic industrial sectors, calling for the cultivation of industrial talents (talent program), promoting research and development innovation, and facilitating the sustainable development of the industry.
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Exhibition Time
March 26th - 28th, 2025
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Exhibition Venue
Shanghai New International Expo Center
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Booth layout
Unicon's booth number is N1-1343
