The 26th China International Optoelectronic Exhibition (CIOE) will be held at the Shenzhen International Convention and Exhibition Center from September 10th to 12th, 2025. Focusing on eight cutting-edge fields including information and communication, precision optics, camera technology and application, laser manufacturing, infrared and ultraviolet, intelligent sensing, new display and AR/VR.
Unicon booth7B13We sincerely invite you to visit the exhibition. This exhibition is jointly participated by Unicon and KLA INSTRUMENTS. On-site equipment: KLA Filmetrics optical film thickness gauge, KLA optical profilometer, probe profilometer, nanoindentation tester, ellipsometer, etc. If you have any needs for using the above equipment or for sample testing, you are welcome to visit the Unicon booth for on-site understanding and sample testing. There are also rich gifts waiting for you to claim.
Follow the Unicom official account
Reply with [7B13] to make an appointment for registration
Scan the code to register
Get CIOE audience tickets
Date of participation
September 10th - 12th, 2025
Unicon boothRoom 7B13, Hall 7
Audience Invitation
Welcome to scan the QR code above to follow the Unicon official account. Reply with [7B13] to make an appointment and register. You can enjoy multiple great gifts! We have prepared a rich variety of prizes and activities for you to participate in on site!
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Filmetrics F20 single-point portable film thickness Measuring instrument | ||
Whether you want to know the film thickness, optical constants, or the reflectance and transmittance of the material, F20 can meet your needs. It only takes a few minutes to complete the installation. By connecting to the computer via USB, the device can obtain the measurement results within seconds. Based on the characteristics of a certain modular design, the F20 is suitable for various applications. | ||
Related applicationsPhotoresist, process films, dielectric materialsHard coatingParylene,Anti-reflection layerMedical equipment, OLED, glass thickness, ITO and other Tcos. |
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Filmetrics F40 Thin film Measuring instrument | ||
A film thickness measurement system combined with a microscopeFilmetrics' special film thickness measurement system enables users to measure the thickness of films simply and quicklyThe optical constant can be obtained within a few seconds by analyzing the reflection spectrum between the upper and lower interfaces of the film layer to be testedTo the measurement result. | ||
Related applicationsPhotoresist, semiconductor manufacturing, polymers/poly (p-xylene)Biomedical componentsMEMS Micro-electromechanical systemsBox thicknessOxides/nitridesSilicon or other semiconductor film layersThickness of biofilm/bubble wallImplant the drug coatingSilicon filmAluminum nitride/zinc oxide thin film filterPolyimideITO conductive transparent film. |
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Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument | ||
Automated film thickness drawing systemWith the special spectral measurement system of F50, the maximum straightness can be obtained very simply and quicklyThe thickness distribution map of the sample film with a diameter of 450 millimeters. The r-θ polar coordinate moving platform is adoptedIt can very quickly locate the points to be tested and obtain the test thickness in real time, approximatelyIt can test two points per second. The F50 system is equipped with a high-precision and long-life mobile platform, striving toAchieve millions of measurements. | ||
Related applicationsSemiconductor manufacturing LCD liquid crystal displayPhotoresistPolyimideOxides/nitrides /SOIITO transparent conductive filmBackside grinding of wafersOptical coating MEMS micro-electromechanical systemsHard coatingPhotoresistAnti-reflection layerSilicon-based film layer. |
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KLAZeta-20White light confocal profilometer | ||
Multifunctional optical testing moduleThe Zeta-20 offers a variety of optical testing technologies to meet users' testing needs in various fields.Based on ZDot technology, the Zeta-20 can perform imaging analysis on nearly all materials and structures, ranging from ultra-smooth to high roughness, and from low reflectivity to high reflectivityEmissivity surface, transparent to opaque medium. | ||
Related applicationsHui Fluid Devices,IC wafer surfaceMEMS devicesHui gear/micro 杺 machinery, laser drilling, disk chamfering. |
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KLA iMicroNanomechanical tester | ||
Flexible and easy-to-use mechanical tests can be widely applied to various materials and applications.iMicro offers services such as indentation, hardness, scratch testing, and diversified nanoscale testingGrade mechanical testing design. iMicro features multi-range loading drivers, enabling a wide range of applicationsMeasurement is carried out within the range of general loads and displacements. | ||
Related applicationsHard coatingCeramics and glassMetals and alloysComposite materialsCoatings and paintsMedical devicesSemiconductorBatteries and energy storage materialsAutomobiles and aerospace |
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Profilm3D White Light Interference Profilometer | ||
Profilm3D employs the most advanced vertical interference scanning (WLI) and high-precision phase interference (PSI) technologies. Achieve sub-nanometer surface morphology research with strong cost performance. | ||
Related applicationsRoughness measurement Three-dimensional topography characterization Measurement of step height |
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FS-1 multi-wavelength ellipsometer | ||
The Film Sense FS-1 multi-wavelength ellipsometer adopts a long-life LED light source and a non-moving component ellipsometer detector, enabling reliable film measurement in a compact ellipsometer with simple operation. | ||
Related applicationsSilicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon films, photoresists.High and low index films, such as SiO2, TiO2, Ta2O5, MgF2.TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc |
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