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Unicon Technology Co., Ltd., in collaboration with the Huangpu New Materials Industry Federation and its chairman unit (Huangpu Materials Research Institute in the Guangdong Hong Kong Macao Greater Bay Area), will hold a "Seminar on Advanced Material Analysis and Testing of Thin Films" at the Aviation Tire Science Center on April 20th.
This seminar will focus on the measurement of film thickness, surface profile, and defect detection in the fields of electronic chemicals, coatings, semiconductor materials (photoresist), and other related areas for discussion and technical exchange. Research institutions and industry experts have been invited to give keynote speeches on the topic.
The seminar also includes a demonstration of advanced equipment for measuring film thickness. We look forward to this seminar, which will help with semiconductors, panels LED, Exchange in fields such as consumer electronics, biomedicine and film quality control, through the interaction between experts and enterprises, promotes the application of advanced measurement technology in scientific research and production, and jointly achieves the goal of high-quality development.
Meeting Information
meeting time
April 20, 2023
venue
Conference Room on the Third Floor of the Aviation Tire Science Center Exhibition Center
Organization and organizer
Younikon Technology Co., Ltd
Huangpu Materials Research Institute of Guangdong Guangdong Hong Kong Macao Greater Bay Area
Guangzhou Huangpu District New Materials Industry Federation
Meeting agenda
Meeting agenda (tentative) | |
time | content |
09:00-09:20 | Guests enter, conference sign in |
09:20-09:25 | Background introduction of the meeting |
09:25-09:30 | Welcome speech |
09:30-10:00 | Application of thickness measurement and dissolution rate testing of photoresist |
10:05-10:35 | Application of surface contour morphology measurement |
10:40-11:10 | Nanoindentation - Mechanical Application of New Material Thin Films |
11:15-11:45 | Defect scanning detection - application in the direction of wafers and transparent substrates |
12:00-13:30 | Lunch&Rest |
13:40-16:00 | On site machine demonstration&answer |
16:00-16:10 | Easter egg lottery |
Registration method
Offline registration for participation
Scan the QR code to make an appointment and register for the conference
The quota is limited and will be closed upon full enrollment
Schedule a live conference broadcast
Scan the QR code to schedule a live conference broadcast
Online participation provides an opportunity to draw exquisite electronic products
speaker
Application of Thickness Measurement and Dissolution Rate Testing of Photoresist
Chen Rong
R&D Engineer at Huangpu Materials Research Institute
I graduated with a master's degree in Applied Chemistry from Guangdong University of Technology in 2010. I have worked in research institutes, panel manufacturing companies, and listed chemical companies, engaged in the development of panel photoresist formulations, wet electronic chemicals, and adhesive products. Currently, I am responsible for the formulation development of semiconductor photoresist at the KrF photoresist center of Huangpu Materials Research Institute in the Guangdong Hong Kong Macao Greater Bay Area.
Application of Surface Profile Measurement
He Kui
Professor Dongguan University of Technology
Mainly engaged in research on heat and mass transfer processes in energy conversion, microfluidics, continuous flow chemical reactors, computational fluid dynamics, turbulence, and preparation of polymer membrane materials. Proficient in using Fortran language to write scientific computing programs, proficient in Fluent, COMSOL and other software, proficient in high-speed camera systems, high-speed particle imaging systems (PIV), fluorescence microscopes, laser confocal microscopes, microfluidic chip design, CNC machine tool processing, etc.
Nanoindentation - Mechanical Applications of New Materials Thin Films
Zhang Ying
Nanoindentation Application Engineer
In the past 10 years, with a background in the scientific research and analysis instrument industry, focusing on applications related to thin film mechanics, skilled in understanding customers' actual applications and needs, and providing long-term services to numerous research institutes and enterprises in the north as an application engineer for Younikon.
Defect Detection Measurement and Application
Li Yang
General Manager
General Manager of Younikon Technology Co., Ltd., Master of Advanced Business Administration from Shanghai Jiao Tong University, with over ten years of experience in the optical film thickness measurement industry, has a deep understanding of various types of thin film applications, and provides thin film measurement solutions for many well-known customers.
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