- Back |
- Home
- / News
- / Enterprise
- / CHInano 2025 | Younikon is about to participate in the Suzhou International Fair, inviting you to explore cutting-edge applications in precision testing!
CHInano, as the largest nanotechnology exhibition in the country, has gathered a group of exhibitors in the field of precision testing, and the atmosphere of commercial cooperation on site is high. This year's precision testing zone will continue to gather top precision testing platforms and professional equipment industry giants from home and abroad to participate. We sincerely invite you to visit and witness the birth and development of future technology together!
Younikon participated in the Suzhou International Fair with two heavyweight products. Among them, KLA's Filmetrics F50 automatic Mapping film thickness measuring instrument automatically and quickly obtained the thickness distribution map of the film, while the Film Sense multi wavelength ellipsometer has super strong capabilities for measuring nanoscale films.
Hall B1, No. 533, Nikon boothWe have set up a variety of surprise lottery activities on site, and look forward to seeing you all at CHInano 2025!
Scan the code to obtain admission tickets for the visit
Exhibition time: October 22-24, 2025
Exhibition location: Suzhou International Expo Center
Nikon booth:Building B1, No. 533
(There is a diagram below indicating the location)
Exhibition Hall Distribution
Exhibition booth guide
 | ||
Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument | ||
F50 can easily obtain a sample film thickness distribution map with a maximum diameter of 450 millimeters. By using the r - θ polar coordinate moving platform, the required test points can be quickly located and the test thickness can be obtained in real time, with approximately two points tested per second. | ||
Related applications:Semiconductor manufacturing (photoresist, oxide/nitride/SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti reflection layer); MEMS microelectromechanical systems (photoresist, silicon-based film layers). |
 | ||
FS-8 multi wavelength ellipsometer | ||
The Film Sense FS-8 multi wavelength ellipsometer uses a long-life LED light source and a non mobile component ellipsometer detector, which can achieve reliable thin film measurement in a compact ellipsometer with simple operation. | ||
Related applications:Silicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon thin films, photoresist. High and low index thin films, such as SiO2, TiO2, Ta2O5, MgF2. TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc. |
'Polite Interaction'
Forward the article and leave your concerns and insights on semiconductor material thin film testing in the comment section
Selected three friends to give away a beautiful peripheral~
WeChat Official
Support
