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Younikon cordially invites you to attend the 2024 Shanghai SEMICON CHINA event

2026-06-27 16:45:51 admin

Dear customer friends

Unicon Technology Co., Ltd. will participate in the SEMICON CHINA event located at the New International Expo Center on Longyang Road in Shanghai from March 20 to March 22, 2024, with multiple models. ourThe booth number is N1671.Welcome to visit and experienceThere will also be surprise gifts on site.

hall plan

Exhibition Time:

March 20th to March 22nd, 2024

Exhibition location:

Shanghai New International Expo Center

Booth: N1.1671

Official registration entrance Click to enter

There will be a mysterious event at the exhibition booth

Waiting for your participation

Exhibition equipment


F50 film thickness measuring instrument
F50 can easily achieve maximum straightThickness distribution map of sample film with a diameter of 450 millimeters. Using an r - θ polar coordinate moving platform,Can quickly locate the required test points and obtain real-time test thickness, approximatelyTest two points per second.
Related applications:Semiconductor manufacturing (photoresist, oxide/nitride/SOI, wafer backside grinding); LCD liquid crystal display (polyimide, ITO transparent conductive film); Optical coating (hard coating, anti reflection layer); MEMS microelectromechanical systems (photoresist, silicon-based film layers).


P7 stair step meter
The P-7 can perform 2D and 3D measurements of step height, roughness, curvature, and stress, with a scanning range of up to 150mm without the need for image stitching.
Related applications:Thin film/thick film step; Etching depth measurement; Photoresist/photoresist step; Flexible film; Surface roughness/flatness characterization; Surface curvature and contour analysis; 2D stress measurement of thin films; Surface structure analysis; 3D contour imaging of the surface; Defect characterization and defect analysis.


R50 four probe resistivity measuring instrument
The Filmetrics R50 series offers contact based four point probes (4PP) and non-contact eddy current (EC) measurements. Map the resistivity/conductivity of the conductive film at a speed of 1 point/second at the fastest. The electric X-Y stage uses standard chip suction cups to customize sample racks, which can measure up to 300mm of samples or 200mm of area.
Related applications:Silicon wafer doping; Metal layer thickness testing; Wafer resistivity test


Bowman XRF Coating Thickness Gauge
On workpieces with a height not exceeding 9 inches, it has a 12 x12 inch measurable area that is superior to similar products. Automatic multi collimator allows for the selection of spot size to accommodate various feature sizes; The zoom camera allows measurement within a focal length range of 0.25 inches to 3.5 inches.
Related applications:Measurement of refractive index and extinction coefficient of materials; Thickness testing of natural oxide layer on silicon wafer; Optical constant testing of photoresist; Measurement of Metal Thickness on Silicon in Semiconductor Packaging


FS-1 multi wavelength ellipsometer
The Film Sense FS-1 multi wavelength ellipsometer uses a long-life LED light source and a non moving component ellipsometer detector, which can achieve reliable thin film measurement in a compact ellipsometer with simple operation.
Related applications:Silicon dioxide and nitrides, high dielectric and low dielectric materials, amorphous and polycrystalline materials, silicon thin films, photoresist.High and low index thin films, such as SiO2, TiO2, Ta2O5, MgF2.TCO (such as ITO), amorphous silicon thin films, organic thin films (OLED technology), etc