Filmetrics F54 White Light Interference Film Thickness Measuring Instrument
Product Introduction of Filmetrics F54 White Light Interference Film Thickness Measuring Instrument
Filmetrics F54 White light interference film thickness measuring instrumentIt can be powered by an electric deviceR-ThetaThe platform automatically moves to the selected measurement point and rapidly maps the film thickness at a speed of two points per second, SampleDiameter up to450millimeterDozens of built-in concentric circles can be selected,Rectangle,Or linear pattern mode,orEstablish measurement points without any quantity limit on your own.With just basic computer skills, you can create your own recipe within minutes.
Product features of Filmetrics F54 White Light Interference Film Thickness Measuring Instrument
The automated film thickness drawing system enables rapid positioning and real-time result acquisition.
Measurable sample film layer: Basically smooth. Non-metallic films can all be measured.
The surveying and mapping results are available2Dor3DPresentation, facilitating users to view from different perspectives;
Measurement principle of Filmetrics F54 white light interference film thickness Measuring instrument
When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.
Product application of Filmetrics F54 White Light Interference Film Thickness Measuring Instrument
Semiconductor film layer | Display technology | Consumer electronics | Parrylin |
Photoresist | OLED | Waterproof coating | Electronic products/Circuit board |
Dielectric layer | ITOandTCOs | Radio Frequency Identification | Magnetic material |
Gallium arsenide | Thick air box | Solar cell | Medical devices |
Micro-electromechanical system | PVDandCVD | Aluminum shell anode film | Silicone rubber |
Product parameters of Filmetrics F54 White Light Interference Film Thickness Measuring Instrument
Wavelength range | 190nm-1700nm | Light source | Tungsten halogen lamps, deuterium lamps |
Spot size | Standard1.5millimeter | Measurement accuracy2: | 0.02 nm |
Accuracy*Take the larger one | 1nmor0.2% | Stability3: | 0.05 nm |
5XObjective lens thickness range | 20nm-120mum |
For more parameters, please contact us |
Measurement diagram of Filmetrics F54 white light interference film thickness Measuring instrument
