Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument
Product Introduction of Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument
Filmetrics F50 Automatic Mapping Film Thickness Measuring InstrumentWith the help of the spectral measurement system, the thickness distribution map of a sample film with a diameter of 450 millimeters can be obtained simply and quickly. The r-θ polar coordinate moving platform is adopted which can quickly locate the points to be tested and measure the thickness. The testing is very fast, approximately two points can be tested per second. Users can draw the maps of the points they need by themselves.Filmetrics F50 Automatic Mapping Film Thickness Measuring InstrumentConfigure a mobile platform with high precision and long service life to achieve tens of thousands of measurements.
Product advantages of Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument
The automated film thickness drawing system enables rapid positioning and real-time result acquisition.
Measurable sample film layer: Basically smooth. Non-metallic films can all be measured.
The surveying and mapping results can be presented in 2D or 3D, facilitating users to view them from different angles.
Measurement principle of Filmetrics F50 Automatic Mapping film thickness Measuring instrument
When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.
Common industrial applications of Filmetrics F50 automatic Mapping film thickness measuring instrument:
Semiconductor film layer | Display technology | Consumer electronics | Parrylin |
Photoresist | OLED | Waterproof coating | Electronic products/circuit boards |
Dielectric layer | ITO and TCOs | Radio Frequency Identification | Magnetic material |
Gallium arsenide | Thick air box | Solar cell | Medical devices |
Micro-electromechanical system | PVD and CVD | Aluminum shell anode film | Silicone rubber |
Product parameters of Filmetrics F50 Automatic Mapping Film Thickness Measuring Instrument
Wavelength range | 190nm-1340nm | Light source | Tungsten halogen lamps, deuterium lamps |
Thickness measurement range | 5nm-2mm | Measurement accuracy | 0.02 nm |
Spot size | Standard: 1.5 millimeters | Sample stage size | 1-300mm |
Contact us for more parameters |
Measurement diagram of Filmetrics F50 Automatic Mapping film thickness Measuring instrument
