Nanosurf AFSEM Atomic Force microscope for vacuum environment
Product Introduction of Nanosurf AFSEM Atomic Force Microscope for Vacuum Environment:
Nanosurf AFSEM Atomic force microscope for vacuum environmentbyGETecwithNanosurf"Provided,It enables you to easily combine two powerful analytical tools, the atomic force microscope(AFM)With a scanning electron microscope(SEM)Construct the realThree-dimensional surface topography, precise measurement of height information, distance information and even material propertiesBut at the same time, it remained inSEMPositioning within a wide field of viewAFSEMPosition the cantilever beam to the exact position you want to measure. This further greatly expands the feasibility of your related microscope measurement and analysis.
Product features of Nanosurf AFSEM Atomic Force Microscope for Vacuum Environment:
It takes place in real time in your vacuum environmentAFMAnalysis
Convenient integration inSEMConduct relevant activities during the processAFMAnalysis
Compatible with most electron microscopes without any impactSEMNormal operation
It is compatible with vacuum chamber environments and atmospheric environment measurements
The operation is simple and intuitive
Product advantages of Nanosurf AFSEM Atomic Force microscope for vacuum environment:
Perform AFM analysis in real time in your electron microscope
Atomic force microscope(AFM)With a scanning electron microscope(SEM)The mutual complementarity of these makes it possible to uniquely characterize your samples.AFSEMIt enables you to simultaneously perform high-resolution imaging on your samples, construct a realistic three-dimensional surface topography, and precisely measure height information, distance information, and even material properties,But at the same time, it remained inSEMPositioning within a wide field of viewAFSEMPosition the cantilever beam to the exact position you want to measure. OptimizedAFSEMWorkflow(It doesn't affectSEMNormal operation)Ensured efficient operation,Powerful control software can achieve intelligent measurement, system operation and data analysis.
SEM-AFM correlation analysis
For product or material analysis,We always expect to use multiple techniques for sample analysis and seek correlations among parameters,And like atomic force microscopes(AFM)And scanning electron microscope(SEM)For this type of imaging technology, we hope to conduct the analysis at the same precise position!
A variety of other analytical technology tools that are synchronized with AFM and SEM
BecauseAFSEMThe design retains everythingSEMFunctionally, it can be combined with some other standardsSEMAnalytical techniques such asFIB,FEBIDwithEDXFor instance, samples do not need to be scanned, and relatively heavy or customized sample stages, such as tension traction stages, nanoindentation stages, etc., can all be easily combinedAFSEM"Chinese.
Compatible with most electron microscopes without any impactSEMNormal operation
AFSEMCompatible with mostSEMOr a dual-beam system(SEM/FIB):It is directly installed on the door of the system chamber,Without changing the sample stage itself. Moreover, the narrow tip scanning design, in combination with the self-sensing probe system, only requires the tip of the electron column and the sample4.5mmSpace is fine. SoAFSEMIt is compatible with most standard and optional sample stages, and can handle almost any sample that can be placed in the system chamber. This design enables the measurement of step heights at the sub-nanometer level in an electron microscope.
The operation is simple and intuitive
AFSEMIt provides operational flexibility and intelligent positioning,The three-axis coarse positioning stage moves the probe in or outSEMLocate the position in the field of view and position the probe to the position of interest,SEMIt is convenient to move the sample horizontally on the sample stageAFSEMwithSEMMeasurement:Vertically,AFMIt can be moved together with the sample,It enables you to move the sample up and down safely without damaging itAFMProbe. A customized adapter board and circuit seal can be used inSEMIt is realized inAFSEMInstallation,AFSEMIt can be installed or removed with just four screws,The entire process can take less than five minutes and can be quickly and conveniently integrated or removed from the system. All probes are pre-installed on a standard interface, allowing for quick probe replacement,Therefore, it greatly saves the systemdownMachine time. Because of the self-sensing probe technology and fully automated probe positioning adjustment,AFSEMThe system can start operating immediately.
Components and accessories of Nanosurf AFSEM Atomic Force microscope for vacuum environment:
AFSEM Measuring head
AFSEMTool set (including probe
"Positioning"AFSEMFor the measuring headXYZSample stage+SEMCustomize the matching plate and the flange between the seal
Controller, high-voltage amplifier, computer (in one control cabinet)+Software
AFSEMProbe
Common measurement modes of Nanosurf AFSEM atomic force microscope for vacuum environment:
Static force imaging | Dynamic force imaging | Phase imaging |
Conductive electric force atomic force microscopeC-AFM) | Force spectrum measurement | Force modulation imaging |
Nanosurf AFSEM atomic force microscope image in vacuum environment:
