Bowman B Series XRF High Precision Coating Measurement System | Nikon

Bowman B series XRF high-precision coating measurement system

Name: Bowman B系列 XRF高精度镀层测量系统
Brand: Bowman
Availability: InStock

Micro focused X-ray tube+porous capillary optical focusing | high-precision micro area coating thickness and composition analysis

Bowman B Series XRF镀层测厚仪

Al ~ U

Element measurement range (13-92)

≤100μm

Micro focused spot

5th floor

Maximum coating (including substrate)

25 types

Simultaneously analyze elements

190eV

SDD detector resolution

Xralizer

Intuitive software · One click report

产品介绍

Bowman B series X-ray fluorescence (XRF) coating thickness gauge provided by Younikon TechnologyBy using micro focused X-ray tubes and porous capillary optical focusing devices, the measurement spot can be effectively reduced to less than 100 μ m, while the X-ray excitation intensity can be increased several times or even tens of times, achieving high-precision micro area measurement. The element measurement range covers aluminum element 13 to uranium element 92, and can analyze up to 5 layers of coating (including substrate) simultaneously, as well as analyze the composition of 25 elements simultaneously.

The system comes standard with SDD silicon drift detector or Si PIN solid-state detector, with a resolution of 190eV or higher, which can meet strict requirements for micro area, ultra-thin coating, and trace element analysis. It can measure the thickness and composition ratio of single-layer coatings (Au/Ag/Ni/Cu/Sn/Zn, etc.), alloy coatings (ZnNi/SnPb, etc.), multi-layer coatings (Au/Ni/Cu, Au/Pd/Ni/Cu, etc.), as well as the concentration of metal ions and ROHS harmful elements in the electroplating solution.

Equipped with intuitive Xralizer software, supporting batch number retrieval, one click report generation, custom report format, and password protection, all results are automatically saved. Suitable for industries such as semiconductor wafers, PCB circuit boards, lead frames, connectors, fasteners, automotive parts, aerospace, jewelry, electronic components, pipelines, cutting tools, etc.

Bowman Classic Model

Bowman B系列 It is the basic and conventional model of Boman, which adopts a top-down measurement method and is equipped with a fixed sample table for manual operation. When measuring, place the sample in the sample compartment and align it with the position inside the crosshair on the screen by observing the video image to complete the measurement. The operation is intuitive and reliable.

核心优势

Micro focused X-ray optics

A porous capillary optical focusing device with a spot size of less than 100 μ m and an excitation intensity increase of several times to tens of times, achieving high-precision micro area measurement.

High resolution solid-state detector

SDD or Si PIN detector with a resolution of 190eV or higher, no need for secondary filters, long-term stable peak position, and no need for frequent calibration.

Wide element and coating range

Measure 13Al~92U elements, up to 5 layers of coating (including substrate), and analyze the composition of 25 elements, covering single-layer/alloy/multi-layer coatings.

Xralizer Intelligent Software

Intuitive user interface, batch number retrieval, one click report generation, custom report format, password protection, and automatic saving of all results.

Flexible configuration upgrade

Standard configuration fixed collimator, can be upgraded to multiple collimators, variable focal length cameras, and SDD detectors to meet different application needs.

Global Service Support

Younikon has a demonstration center, training center, and spare parts warehouse in Shanghai, China, and offices in Shenzhen, Hangzhou, and Xi'an to provide thoughtful solutions and fast after-sales service.

Typical application areas

semiconductor wafer

PCB circuit board

Lead frame

connector

fastener

auto parts

aerospace

jewelry

Electronic components

Pipeline/cutting tools

Analysis of Electroplating Solution

ROHS Harmful Elements

测量原理

Principle of X-ray Fluorescence (XRF)

The Bowman B series uses X-ray fluorescence principle to measure coating and composition. When high-energy X-rays irradiate the surface of a metal thin film, the incident photons knock out the inner layer electrons of the film or substrate material atoms to form holes. When the outer electron transitions to fill the hole, it releases characteristic X-ray fluorescence, whose energy corresponds one-to-one with the atomic number of the element. The element can be qualitatively analyzed by the energy of the fluorescence, and the thickness and composition can be quantitatively analyzed by the fluorescence intensity.

Micro area focusing and high sensitivity

The porous capillary optical focusing device reduces the X-ray beam spot to<100 μ m and significantly enhances the excitation intensity, making it particularly suitable for high-precision analysis of small measurement areas and ultra-thin coatings (such as semiconductor wafers and lead frame micro areas). The SDD detector provides superior energy resolution, ensuring the reliability of trace element detection.

产品参数

Element measurement range	Aluminum element 13 to uranium element 92	X-ray tube	50W (50kV, 1mA) micro focused tungsten target
detector	SDD silicon drift detector/Si PIN solid-state detector, resolution ≥ 190eV	spot size	＜ 100 μ m (porous capillary focusing)
analytical ability	Up to 5 layers of coating (4 layers+substrate), with 10 elements per layer, and up to 25 elemental compositions analyzed simultaneously	Measurement application	Thickness and composition of single-layer/alloy/multi-layer coatings, ion concentration of electroplating solution, ROHS harmful elements
software	Xralizer (batch number retrieval, one click report, custom format, password protection)	Standard Configuration	Fixed collimator, fixed focal length camera, solid-state PIN detector, micro focused X-ray tube
Optional upgrade	Multiple collimators, variable focal length cameras, SDD detectors	sample stage	Fixed sample stage, manual operation, video image alignment
For more customized configurations and detailed parameters, please contact Younikon Technology

产品应用详解

Single layer and alloy coating

Accurately measure the thickness of single-layer coatings such as Au, Ag, Ni, Cu, Sn, Zn, etc; Simultaneously analyze the thickness and composition ratio of ZnNi, SnPb and other alloy coatings to meet the requirements of electroplating process control.

Analysis of multi-layer coatings

Supports multiple multi-layer coating structures such as Au/Ni/Cu, Sn/Ni/Cu, Cr/Ni/Fe, Au/Pd/Ni/Cu, etc. The thickness of each layer can be obtained in one measurement, which helps in the quality control of high-end electronics and automotive components.

Electroplating solution and ROHS

Can analyze the concentration of metal ions in the electroplating solution and monitor the lifespan of the electroplating solution; Quickly screen for ROHS harmful elements (Pb, Hg, Cd, Cr, etc.) to ensure product compliance.

Micro area and ultra-thin coating

The combination of micro focused spot and high-sensitivity SDD detector meets the high-precision measurement needs of small areas such as semiconductor wafers, lead frames, connectors, and ultra-thin coatings (nanometer level).

客户评价

The Bowman B series micro focused XRF helps us precisely control the thickness of the gold plating layer on the connector, with small light spots and high excitation efficiency. The measurement results are consistent with the laboratory, greatly improving the yield of the production line. ”

——Quality Department of Electronic Connector Manufacturer

The Xralizer software is used for the analysis of copper plating and tin plated lead alloys on PCB circuit boards. It is easy to operate, and one click report generation is very convenient. The after-sales technical support responds quickly. ”

——PCB board manufacturer's process engineering department

常见问题

What coating combinations can Bowman B series measure?+

It can measure the thickness and composition ratio of single-layer coatings (Au/Ag/Ni/Cu/Sn/Zn, etc.) and alloy coatings (ZnNi/SnPb, etc.), as well as multi-layer coatings such as Au/Ni/Cu, Au/Pd/Ni/Cu, etc. It can analyze up to 5 layers of coatings (including substrate) simultaneously.

What are the advantages of micro focused light spots?+

The porous capillary optical focusing device reduces the light spot to<100 μ m and significantly increases the X-ray excitation intensity, making it very suitable for measuring small areas (such as semiconductor wafers, lead frames, connectors) and ultra-thin coatings, ensuring measurement accuracy.

What functions does the software support?+

Xralizer software provides an intuitive user interface that supports batch number retrieval, one click report generation, custom report formats, password protection, and automatic saving of all measurement results to a database for easy traceability and management.

Can the B-series be upgraded in configuration?+

Okay. The standard configuration includes a fixed collimator, fixed focal length camera, PIN detector, and can be upgraded to multiple collimators, variable focal length cameras, and SDD detectors to meet more complex measurement needs.

Do you support electroplating solution and ROHS analysis?+

support. The Bowman B series can analyze the concentration of metal ions in electroplating solutions and quickly screen for ROHS harmful elements (lead, mercury, cadmium, chromium, etc.), meeting environmental compliance requirements.

Free sample testing service

Free Sample Testing Service

Not sure if your coating sample is suitable for XRF measurement? We offer free sample testing services! Send samples, professional engineers will use Bowman B-series XRF to conduct coating thickness/composition analysis for you, and provide detailed measurement reports and scheme recommendations.

Tags: Bowman XRF高精度镀层测量