Bowman K series XRF high-precision coating measurement system
The Bowman K series X-ray fluorescence (XRF) coating thickness measurement system provided by Unicon Technology is designed specifically for quality control departments handling a variety of samples, equipped with standard silicon drift detectors (SDD) and long-life 50W microfocus X-ray tubes. The system has 12 inches (304mm) on workpieces with a height not exceeding 9 inches (228mm); 12 inch (304mm) measurable area. Standard configuration includes 4-digit (4, 8, 12, and 24mil) electric multi collimators, with optional sizes covering 2× From 2mil to 60mil, the zoom camera supports focal length adjustment from 0.25 inches to 3.5 inches and can measure concave areas. The system can simultaneously measure up to 5 layers of coatings (substrate+4 layers of coatings), analyze up to 10 elements per layer, and analyze up to 30 element compositions simultaneously. The measurement range of elements covers from element 13 aluminum to element 92 uranium. The servo motor-driven programmable XY platform supports pattern matching and autofocus, the cantilever door design facilitates sample access, and the table view function enables imaging of the entire measurable area and one click navigation positioning. Run Bowman Archer software with an intuitive GUI interface that supports custom Excel reports, and data can be seamlessly exported to the ERP system. The system complies with industry standards such as ASTM B568, DIN50987, ISO 3497, and IPC-4552. Suitable for coating thickness measurement and elemental composition analysis in industries such as PCB circuit boards, semiconductor wafers, connectors, electronic components, lead frames, fasteners, automotive parts, aerospace, jewelry, and hardware decoration. Younikon Technology provides professional technical support and after-sales service.
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Name
: XRF 高精度镀层测量系统 -
Brand
: Bbowman 博曼 -
Model
: K系列 -
Origin
: 美国

