Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscope
The Nanosurf Flex ANA automatic force spectrum imaging atomic force microscope provided by Unicon Technology is an automated solution for AFM nanomechanical analysis. XY scanning range of 70 μ m × 70 μ m, electric sample stage stroke of 32mm × 32mm × 5mm, supporting 5mm sample height fluctuation, optional one hundred μ m Z -direction piezoelectric ceramic extension force spectrum range, positioning accuracy better than 1 μ m. The system automatically performs force spectrum measurement (force distance curve) on each pixel during the scanning process, generating a quantitative mechanical property distribution map that accurately matches the morphology map. The workflow software 'MyANA' supports intelligent operations from sample installation to result output, and can measure viscoelasticity, hardness, adhesion, and indentation depth. Specialized analysis software supports easy comparison of large quantities and complex data. It is suitable for biomedicine (cell/tissue/scaffold/hydrogel), polymer materials, medical catheters, nanocomposites, tissue engineering, life sciences and other fields. Younikon Technology provides professional technical support.
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscope Product Introduction:
Nanosurf Flex-ANA Automatic force spectrum imaging atomic force microscopy is an automated solution based on nanomechanical analysis using atomic force microscopy. It aims to study the nano mechanical properties of materials (such as cells, tissues, scaffolds, hydrogels and polymers) on a variety of or large samples through force spectra and efforts in an intuitive and automated manner. It has advantages for multiple samples or samples with large fluctuations.
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscope Product Features:
Only a few steps are needed from sample installation to obtaining results
Automatic nano mechanical performance analysis of high fluctuation samples or multiple samples
Measure viscoelasticity, hardness, adhesion, and indentation depth for different models
Intelligent software autonomously processes measurement requirements
The height fluctuation of the sample can reach5mmRange of force spectrum curveZTowards accessibility one hundredμm
Specialized analysis software can be used for easy comparison of large quantities and complex data
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscope Product Advantages:
Nanomechanical analysis of large or multiple samples
ANAThe software adopts an intuitive workflow based experimental process, the hardware elements and motor drivers of the system, as well as carefully designed and controlled algorithms. The combination of the three isFlex-ANAThe system's logo. Just click to have coverage of the entire accessible32 mm ×32 mmThe overview image of the large field of view of the sample area can define the measurement positions of large or multiple samples. The system can easily overcome up to5 mmThe height difference is significant, and multiple types of nanomechanical measurements, analyses, and modes can be performed and used!
Easily handle demanding samples
During the experiment,ANA Coordinate the scanning head and electric system XYZ Translation stage (range:32 mm × 32 mm × 5 mm）Move to cope with significant changes in sample height. The system can choose to be equipped with additional one hundredμm Z Piezoelectric ceramics are used to expand the range of force spectra. Therefore, samples with macroscopic and microscopic roughness ranging from a few millimeters and micrometers, as well as soft and viscous samples, can be easily processed.
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscopy Measurement Principle:
Nanosurf Flerx-ANA Automatic force spectrum imaging atomic force microscope automatically performs a force spectrum measurement (force) on each pixel point during the scanning process-The distance curve is used to extract local mechanical parameters and generate a quantitative mechanical property distribution map that accurately matches the morphology map, thereby simultaneously revealing the surface morphology and mechanical heterogeneity of the sample at the nanoscale. This greatly improves the efficiency and spatial resolution of traditional single point force spectra.
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscopy Element:
FlexAFMscanning head
C3000controller
ATS 204Automatic Mobile Station
Active isolation table
5MPAuxiliary optical camera
High end computers are used for data acquisition and analysis
Flex-ANAMeasurement and analysis of data
Optional100μm Z-actuator
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscopy Common Industrial Applications:
cell | organization | support | Hydrogel | Polymers, etc |
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscope Product Parameters:
Scope（X/Y/Z）： | 32/32/5mm | Optional δzScope: | 100μm |
positioning accuracy(X/Y/Z/δZ): | <1/< 1/<1/< zero point zero zero oneμm | Repositioning accuracy(X/Y/Z): | <2μm |
More parameters can be obtained by contacting us |
Nanosurf Flex ANA Automatic Force Spectral Imaging Atomic Force Microscopy Measurement Image:
