HORIBA UVISEL Plus Elliptical Polarization Spectrometer
The HORIBA UVISEL Plus research grade classic ellipsometer provided by Unicon Technology uses 50kHz high-frequency PEM phase modulation technology to measure the optical path without any moving parts, with a spectral range covering 190-2100nm (FUV to NIR). The measurement range of film thickness ranges from a few angstroms to 50 micrometers, with high precision required for ultra-thin films and high spectral resolution required for ultra-thin films. FastAcqTM fast acquisition technology doubles the testing sensitivity, and millisecond level dynamic acquisition mode supports online real-time monitoring. Automatic protractor with a variable angle range of 40 ° -90 ° and a step size of 0.01 °; Micro light spots can be selected from 50 μ m-100 μ m-1mm; The detectors provide optimized PMT and IGA detectors for ultraviolet, visible, and near-infrared, respectively. Equipped with DeltaPsi2 and Auto Soft dual software interfaces, it meets the dual needs of research level users for deep modeling and non professionals for one click operation. Suitable for semiconductors (high k/low k dielectric SOI、SiC、GaAs）、 Fields such as flat panel displays (OLED, TCO), photovoltaic solar energy (CIGS, CdTe), optical coatings, data storage, nanotechnology, biomedicine, and materials science research. Younikon Technology provides professional technical support.
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Product Introduction:
HORIBA UVISEL Plus Phase modulated ellipsoidal polarization spectroscopyThe instrument is based on a new version of electronic devices, data processing, and high-speed monochromators,FastacqTechnology can provide users with high-resolution and fast data collection.FastAcqSpecially designed for thin film characterization,Dual modulation technologyEnable you to obtain complete test results.Phase modulation and achromatic optical designThe combination provides a special film thickness testing effect. The special design equipped with a dual monochromator system meets the expectations of users. Through modular design and more accessory options, the instrument can be used flexibly. Can characterize various thin film materials,Including dielectric thin films, semiconductors, organic compounds, metals, metamaterials, and nanomaterials.
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Product Advantages:
Sensitivity: There is a significant improvement in measurement speed
UVISEL PlusPhase modulated ellipsometer provides simple and fast polarization modulation, which can be used for measuring various samples,FastAcqThe rapid acquisition technology has improved the sensitivity of testing, enabling the acquisition of more information on interface films and nanoscale low contrast substrate samples.
flexible
UVISEL PlusThe modular design of the phase modulation ellipsometer allows for flexible expansion to meet your application and budget requirements. Compared to other suppliers, UVISEL PlusThe upgradable performance of the phase modulation ellipsometer system will better meet your future application needs(190-2100nm)Calibration only takes a few minutes.
simple
AutoSoftThe software interface is characterized by intuitive workflow, making data collection and analysis more convenient and easy for non professionals to operate.
fast
UVISEL PlusPhase modulation ellipsometer integratedFastAcqRapid collection technology can be used in3Realize high-resolution samples within minutes(190-2100nm)Calibration only takes a few minutes.
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Product Measurement Principle:
HORIBA UVISEL Plus Ellipsometer is a non-contact measurement method that utilizes the optical properties of thin films to measure film thickness. Measure the thickness and refractive index of thin films based on the state changes during polarized light reflection or transmission. When polarized light is irradiated onto the surface of a thin film, the polarization state of reflected or transmitted light will change, which depends on the thickness, refractive index, and polarization state and angle of the incident light of the film. By analyzing these changes, the thickness of the film can be accurately derived.
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Software:
AutoSoftThe software provides one click testing and analysis. The accompanying click and play menu library helps you control all ellipsometry analysis.
Customized menu
Create your own menu, perform data collection, and automaticallymappingAnalysis of thin film structure can be achieved with just one click. Complete material and model database
AutoSoftThe software provides a large number of material models for you to describe and set up materials and film systems.
Multi value calculation
Multi value calculation isHORIBAThe algorithm can quickly and accurately find the appropriate results. Multi value calculation can be applied to the calculation of film thickness and other dispersion parameters, which can reduce the tedious fitting steps.
DeltaPsi2 provides full functionality services for ellipsometry
DeltaPsi2The software provides full functional control from testing to modeling analysis, output reports, and automatic operation, without the need to switch between multiple software, making daily testing more convenient.
HORIBA UVISEL Plus phase modulation ellipsometer technology features:
The signal acquisition process has no moving parts
No additional components in the optical path
High frequency modulation50kHz
Test the full range of ellipsoidal angles, Ψ(0-90，∆(0-360)
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Common Applications:
Reflection and transmission ellipsometry testing | roughness | interface | Gradient layer |
periodic structure | anisotropy | alloy | nanoparticle |
Band gap calculation | n,kMulti value calculation | Scattering test | Multiple incidence angle ellipsometry |
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Industry Applications:
Dielectric film | semiconductor | organic matter |
metamaterial | nanomaterials | AndMore… |
HORIBA UVISEL Plus Elliptical Polarization Spectrometer Product Parameters:
| UVISELPlus | UVISELPlusNIR |
Spectral range: | 190-885nm | 190–2100nm |
light source | 75Wxenon lamp |
Contact us for more parameters… |
