Filmetrics F32 Light reflection type film thickness gauge

Product Introduction of Filmetrics F32 Light Reflection Film Thickness Gauge
Filmetrics F32 Light reflection type film thickness gaugeThe special spectral analysis system adopts half-width3u rack- mountChassisAdd the additional onesSpectrophotometerIt can reach four different positions(EXRandUVXThe version can be located at most two positions).F32The software of the film thickness gauge can be accessed digitallyI/OOr use the host software to control the startup/Stop/Reset measurement. The measurement data can be automatically exported to the host software for statistical process control. Optional lens assemblies are also provided for convenienceIntegrate into the existing production facilities.
Filmetrics F32 Light Reflection film thickness gaugeProduct features and advantages
Non-contact measurement: Avoids damaging the film, suitable for fragile or sensitive materials;
High precision and wide measurement range&The vertical resolution reaches the nanometer level, and the measurable thickness range is from1nmto3mm;
Multi-scenario applicability: Basically, all smooth, semi-transparent or low absorption coefficient films can be measured.
Fast measurement speed: After configuration is completed, the measurement can be finished within seconds.
Pre-installed100A variety of materials make it easy to measure single-layer and multi-layer films
Optional lens assemblies are provided for convenienceIntegrate into the existing production facilities.
Filmetrics F32 Light Reflection film thickness gaugeProduct measurement principle
When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.

Filmetrics F32 Light Reflection film thickness gaugeProduction application and film layer examples:
Film characteristicsThickness, reflectance, transmittance, optical constant, uniformity, etching amount, etc
Types of filmsTransparent and semi-transparent films, commonly such as oxides, polymers and even air
"Film state"Solid, liquid and gaseous films can all be measured
Thin-film structureSingle-layer film, multi-layer film; Plane, curved surface
Filmetrics F32 Light Reflection film thickness gaugeCommon industrial applications of the product:
Semiconductor film layer | Display technology | Consumer electronics | Parrylin |
Photoresist | OLED | Waterproof coating | Electronic products/Circuit board |
Dielectric layer | ITOandTCOs | Radio Frequency Identification | Magnetic material |
Gallium arsenide | Thick air box | Solar cell | Medical devices |
Micro-electromechanical system | PVDandCVD | Aluminum shell anode film | Silicone rubber |
Filmetrics F32 Light Reflection film thickness gaugeProduct parameters
Wavelength range | 380-1050nm | Light source | Halogen lamp |
Thickness measurement range | 15nm-70um | Measurement accuracy | 0.02 nm |
Spot size | The distance between the probe and the sample0.007times | Sample stage size | 1mm-300mm |
Measurement diagram of Filmetrics F32 Light reflection film thickness gauge

