Bowman K Series XRF High-precision Coating Measurement System
Product Introduction of Bowman K Series XRF High-Precision Coating Measurement System
Bowman K Series XRF High-precision Coating Measurement SystemIt has a measurable area of 12 inches (304mm)x12 inches (304mm) on workpieces with a height not exceeding 9 inches (228mm). The automatic multi-collimator allows for the selection of spot sizes to accommodate various feature sizes. The zoom camera allows for measurements within a focal length range of 0.25 inches to 3.5 inches. The programmable platform driven by servo motors can achieve rapid and accurate programmable sample positioning. The cantilever door is designed to facilitate the placement of samples by operators
The table view function can image the entire measurable area, and the operator can navigate to any position with just a click of the mouse. The built-in joystick enables the operator to move the XY platform from the system's control panel without software intervention. And all the othersBowman XRF systemSimilarly, the K series high-precision coating measurement system complies with ASTMB568, ISO3497 and IPC-4552 standards.
The main functions of Bowman K series XRF high-precision coating measurement
XYZ stroke: X: 12 inches (304mm) Y: 12 inches (304mm) Z: 9 inches (228mm)
Optional dual cameras with workbench view
The programmable worktable driven by servo motors moves precisely, quickly and smoothly
Inner cavity dimensions (WDH) : 24 inches (609mm), 24 inches (609mm), 9 inches (228mm)
Workbench size: 12 inches (304.8mm) x12 inches (304.8mm)
High-resolution Silicon Drift Detector (SDD
Closed cavity design
Up to five coatings can be measured simultaneously
Optional built-in joystick
Optional built-in electronic stop device
The cantilever door facilitates sample access and retrieval
RoHS options are available
Advantages of Bowman K Series XRF high-precision Coating Measurement System
XRF system
High-resolution solid-state detectors have excellent elemental resolution capabilities and do not require secondary filters. The peak position remains stable for a long time and does not require frequent recalibration. The closed coupling geometry layout of the X-ray tube and detector provides a greater number of photons. This enables the Bowman system to achieve a low detection limit and relatively high accuracy in a relatively short measurement time.
Intuitive user interface
The software will provide strong support for the performance of the instrument. The analysis data of the Bowman coating thickness gauge is supported by a feature-rich software, which features an intuitive user interface and is simple and user-friendly to operate. Measurement data can be retrieved by batch number, and reports can be generated with one click. Users can create new applications and report formats without any restrictions. All results are automatically saved to the computer database, and password protection can be set at all user levels.
A wide range of coating thickness measurement
The BowmanXRF high-precision coating measurement system can perform high-precision measurement and analysis on elements ranging from 13 aluminum to 92 uranium.
Single-layer coating: Au, Ag, Ni, Cu, Sn, Zn, etc
Alloy coatings: Simultaneous analysis of coating thickness and composition ratio of ZnNi alloy, SnPb alloy, etc
Double-layer coating: Au/Ni/Cu, Sn/Ni/Cu, Cr/Ni/Fe, etc
Three-layer coating: Au/Pd/Ni/Cu, etc
Up to five layers of coatings can be analyzed
It can simultaneously analyze 25 kinds of elemental components
It can analyze the concentration of metal ions in electroplating solutions
It can analyze harmful elements of ROHS
Bowman XRF high-precision coating measurementService support
Bowman provides for usersXRFTechnical support and services. At present, in addition to its headquarters in Chicago, USA, Bowman has established offices or institutions in over twenty countries across four continents around the world. Bowman is always committed to providing on-site technical support services. Bowman has a demonstration application center, training center and spare parts warehouse in Shanghai, China, and offices in Shenzhen, Hangzhou and Xi 'an. We are capable of providing customers with excellent coating thickness detection solutions and prompt, good after-sales service.
Configuration of Bowman K Series XRF High-precision Coating Measurement System
Bowman K Series XRF High-precision Coating Measurement SystemThe standard configuration includes a 4-bit (4, 8, 12 and 24mil) multi-collimator; The available sizes range from 2x2mil to 60mil. The variable focal length facilitates measurement in concave areas. The programmable platform driven by the same service motor can measure parts through the optional xyz program. The program can use pattern matching and auto-focusing to ensure the accuracy of the measurement.
Like all Bowman XRF high-precision coating measurement systems, the K series is equipped with a standard silicon drift detector (SDD) and a long-life micro-focusing X-ray tube.
Measurement principle of Bowman K series XRF high-precision coating measurement system:
The BowmanXRF X-ray device measures coatings and compositions based on the principle of X-ray fluorescence. When high-energy X-rays irradiate the surface of a metal film, the incident photons knock out the inner electrons of the atoms in the film or substrate material to form holes. When outer electrons transition to fill holes, characteristic X-ray fluorescence is released, and its energy corresponds one-to-one with the atomic number of the element. Through the energy of the fluorescence, we can know which elements are present in the sample. By analyzing the intensity of XRF, we can obtain the thickness of the sample and the composition of each element.
Industry applications of Bowman K Series XRF high-precision Coating Measurement System
Semiconductor | Circuit board | Electroplating | Automobile |
Aerospace | Jewelry/Jewels | Connector | Fastener |
Electronic components | Lead frame | Pipeline | Cutting tools |
Product parameters of Bowman K Series XRF High-precision Coating Measurement System
Element measurement range | From aluminium element 13 to uranium element 92 |
X-ray tube | 50W (50kV and 1mA) micro-focusing W anode tube (Cr, Mo, Rh anodes available) |
Detector | Collimation: Silicon solid-state detector, with a resolution of 190eV or higher
Optical components: Large-window silicon solid-state detector, with a resolution of 190eV or higher |
Number of analysis layers and elements: | There are 5 layers (4 layers + foundation), with 10 elements in each layer. Simultaneously analyze the composition of up to 30 elements |
For more parameters, please contact us |
Real machine diagram of Bowman K Series XRF high-precision Coating Measurement System
