Filmetrics F60-t Automatic Light Reflection film thickness gauge

The Filmetrics F60-t automatic light reflection film thickness gauge is just like our F50 film thickness measuring instrument product. The main mapping focuses on the thickness and refractive index of the film. But it has added many functions for the production environment. These functions include automatic groove detection, automatic reference determination, fully enclosed measurement platforms, industrial computers pre-installed with software, and models upgraded to fully automated wafer transfer.

Name：自动光反射膜厚仪

Brand ： Filmetrics

Product model ： F60

Place of Origin：美国

Filmetrics F60-t Automatic light reflection film thickness gauge

Picture Keywords

Product Introduction of Filmetrics F60-t Automatic Light Reflection Film Thickness Gauge

Filmetrics F60-t Automatic light reflection film thickness gaugeJust like oursF50White light interference film thickness measuring instrumentThe products are the same. Main surveying and mappingFilm thicknessandRefractive index. But it has added many functions for the production environment. These functions include automatic groove detectionAutomatic benchmark determinationFully enclosed measurement platforms, industrial computers pre-installed with software, and models that can be upgraded to fully automated wafer transfer.

Features and advantages of Filmetrics F60-t automatic Light Reflection film thickness gauge

The automated film thickness drawing system enables rapid positioning and real-time result acquisition.
Measurable sample film layer: Basically smooth. Non-metallic films can all be measured.
All systems use intuitive standard analysis software;
Automatic detection of grooves
Automatic benchmark determination
Fully enclosed measurement platform

Measurement principle of Filmetrics F60-t automatic light reflection film thickness gauge product:

When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.

Picture Keywords